38 sample positions for greater capacity per loading cycle
Quick, tool-free installation and removal. No set-screw tightening required.
High-precision electron-optical imaging system
Integrated load-bearing platform made of natural stone
Elastic modulus approximately 2–3 times that of artificial composite materials such as concrete
Static deformation under the same load reduced by more than about 60%
No hydration shrinkage, helping maintain long-term geometric stability
Multi-point pneumatic vibration isolation with automatic leveling
System natural frequency as low as 1.5 Hz
Vibration isolation efficiency: up to approximately 98% at 10 Hz
Maximum load per point 6.0 kN
Software-controlled fine leveling in 0.1 mm increments
Provides 9 digital I/O channels for instrument control
Output noise ≤ 1 mVpp under typical test conditions
18-bit / 262,000-step high-precision objective lens adjustment
1 ms response time to load changes
Reduces the effects of current fluctuations and circuit noise on imaging
Reduces transmission of environmental interference to the electron optical system
Suppresses 50–500 Hz acoustic disturbances
Attenuates magnetic fields at 50/60 Hz mains frequencies
Reduces high-frequency electromagnetic interference coupling
AiSEM F1 combines fully automated imaging with multimodal interaction. Its intelligent agent breaks down tasks and manages a closed-loop workflow, from locating samples and adjusting parameters to capturing images. This reduces the time spent on manual operation and supports complex samples, frequent imaging tasks, and extended imaging runs.
AiSEM F1 images multiple samples and regions at multiple magnifications in a single run. It overcomes throughput bottlenecks in conventional electron microscopy and delivers results faster, supporting materials development at scale in catalysis, semiconductors, lithium batteries, and polymers.
XLING, our pioneering AI-native agent for scientific instruments, enables AiSEM F1 to understand tasks, plan execution strategies, and control instrument functions in a closed-loop workflow from task input to data output.
| Model | AiSEM F1 | AiSEM F1 Pro |
|---|---|---|
| Electron Gun Type | Schottky field emission electron gun | |
| Resolution | 0.9 nm at 15 kV 1.3 nm at 1 kV 0.7 nm at 15 kV (with algorithmic optimization) 1.1 nm at 1 kV (with algorithmic optimization) |
|
| Beam Current Range | 1 pA–20 nA (100 nA optional) | |
| Accelerating Voltage | 0.02–30 kV | |
| Magnification | 10×–2,000,000× | |
| Electron-Optical Technology | In-column beam deceleration Compound electrostatic–magnetic objective lens Leakage-free magnetic objective lens |
|
| Standard Detectors | Chamber secondary electron detector (ET), in-column secondary electron detector (InColumn) | |
| Optional Detectors | Backscattered electron detector (BSD), scanning transmission electron detector (STEM) | |
| Optional Accessories (Third-Party) | EDS, EBSD, CL, in-situ devices | |
| Stage Travel | Standard: X/Y: 0–125 mm; Z: 0–50 mm; R: continuous 360° rotation; T: −5° to 70° / Optional: X/Y: 0–140 mm; Z: 0–60 mm; R: continuous 360° rotation; T: −10° to 90° | |
| Automatic Functions | Autofocus, automatic astigmatism correction, automatic brightness and contrast adjustment, automatic centering | |
| Control Method | AI voice control, knob panel + trackball control, keyboard and mouse control | |
| Computer Configuration | CPU: i7-14700 | Built-in local model CPU: Intel Core i9-14900K Enhanced computing configuration AI compute performance: up to approximately 4,000 TOPS |
| Software Languages | Chinese and English; additional languages available on request | |
AiSEM F1 is a next-generation field emission scanning electron microscope with a self-evolving AI agent built into its core. It understands tasks through AI and automates the imaging workflow, helping academic and industrial researchers capture images more efficiently.
Email: info@scipolaris.com
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